Wednesday 2nd June

Card Testing International recently attended the ISO Working Group 1 meeting that took place in London. WG1 consists of a panel of international experts working in the industries of card manufacture, card issuance & card reader hardware. Working Group meetings offer a forum for discussion on developing international standards, pertaining to card compliance, interoperability and durability.

During this latest meeting, CTI put forward a Test Method for a Chip Card test to ensure compliance to part of the ISO 7810 standard, along with demonstrating the test equipment that we developed for this purpose. CTI are now assisting the Working Group in drafting this addition to the ISO Test Method document accompanying this standard, with a view to it's publication in the next edition.