CTI will be attending the ISO/IEC WG 1 (Working Group 1) meeting held in March 2011 at Menlow Park, San Francisco, USA in order to discuss ongoing development of ID Card Standards with likeminded industry experts. WG 1 primarily focuses on Physical Characteristics, Card Durability and Test Methods for Embossed Magnetic Stripe Cards. Several areas of common interest also lie between WG 1, and the Working Groups concerned with Contact IC & Contactless IC cards (WG 4 and WG 8 respectively.)