CTI's Development Specialist will be attending the ISO/IEC WG 1 meeting held in June 2011 at Fargo, North Dakota, USA in order to discuss ongoing development of ID Card Standards with like minded industry experts. WG 1 primarily focuses on Physical Characteristics, Card Durability and Test Methods for Cards.

Discussion topics this time include a review of an IC Card durability Test Method that CTI has developed, along with suitable test equipment for performing the test. Also further discussions into the developing Card Service Life Standard will be held, as this nears its final stage of publication.