CTI Hosts ISO WG1 Card Experts Meeting

Earlier in March, Card Testing International was pleased to host a very successful ISO Card Experts meeting in Queenstown, New Zealand. Many thanks go out to our sponsors, MagTek Inc. and Millenium Technology, for their assistance in making this meeting a success.

Featured in the photo above, from left to right: David Reynolds - Technical & Sales Manager for CTI, Uwe Truggleman – ISO/IEC SC17 WG1 Convener, Honourable Bill English – Deputy Prime Minister of New Zealand, Ron DeDera – Director & Founder of CTI.

Delegates representing USA, Japan, Germany, France, UK & New Zealand took part in technical discussions over the 3 days, and the meeting was very productive. Standards such as ISO/IEC 7810 Physical Characteristics, and its corresponding ISO 10373-1 Test Method were worked upon. The addition of an Integrated Circuit Chip Card Durability Test Method that Card Testing International has had direct input to, in collaboration with the German National Body, was one of the latest developments.

The ISO/IEC 24789 Card Service Life Standard, was also the subject of discussions, refining the first part of this Standard which aims to look at the environment and usage pattern of a card product, in order to develop an Application Profile determining the testing regime to be used in order to see if the card meets the associated durability requirements.

WG1 meetings are held 3 times a year, in locations worldwide. Having this industry focus, allows Card Testing International to have a direct input into the Standards & Test Methods designed to ensure that card products meet appropriate compliance & durability criteria, ultimately leading to better card products for the marketplace.