Card Testing International is one of the few independant card testing laboratories in the worldCard Testing International is one of the few independant card testing laboratories in the world
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Individual ISO Tests

Card Stock Testing

Non ISO durability tests

Card pre-acceptance quality control

Problem Card Analysis/Fault Diagnosis

Branch Encoder quality review programmes

Bulk Encoder/Embosser preventative maintenance & trending

Educational Seminars

Card Testing International is one of the few independant card testing laboratories in the world

CTI can provide testing and consultancy for the following ISO specifications:

ISO 7810 Physical card characteristics

ISO 7811-1 Embossing

ISO 7811-2 Recording technique - magnetic stripe low coercivity

ISO 7811-3 Location of embossed characters

ISO 7811-4 Location of read only magnetic tracks

ISO 7811-5 Location of read-write magnetic tracks

ISO 7811-6 Recording technique - magnetic stripe high coercivity

ISO 7811-7 High Density encoding

ISO 7816-1 Contact chip card tests

ISO 7816-2 Chip cards - Contact Location & Size

ISO 7813 Financial transaction cards

ISO 10373 series - test methods
ISO - KEY/PIN management
Other ISO tests as agreed

ANSI durability testing

We are able to perform a few non ISO tests that investigate the durability aspect of a plastic token.

These non ISO tests, when performed in conjunction with the ISO delamination, ISO Table 1 (inherent magnetic stripe characteristics) and a few other ISO tests, will help qualify the durability/longevity of card stock.

This qualification becomes important if you want the card token to last until its planned expiration date, and even if expiration dates are intended to be extended, making your card products last longer.

If steps are taken to ensure the card is initially produced to an optimum high quality level, including its durability, there is more room for natural ‘wear and tear’ deterioration to occur before card reliability becomes a problem.

These non-ISO laboratory tests are designed to emulate some relative wear and tear field conditions. The results can be used for comparison purposes between different card batches. Either for future runs of the same product, or between different card products.

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