CTI will be attending the ISO/IEC WG1 Card Experts meeting held October 2014 in Salamanca, Spain in order to discuss ongoing development of ID Card Standards with like-minded industry experts. WG1 primarily focuses on Physical Characteristics, Card Durability and Test Methods for Cards.

Discussion topics this time include the next revision of the Card Service Life Standard, Devices on Cards (LCD Displays, Biometrics etc.) and ongoing development of the Electrostatic Conductivity test.

The WG1 meeting is held back to back with the ISO/IEC SC17 Plenary – a convention of worldwide Experts in a diverse range of fields relating to Cards & Personal Identification, ranging from Biometrics to Passports & Drivers Licenses.