• 01-ensuringyourcard.jpg
  • 02-fannedcards.jpg
  • 03-fannedcards.jpg
  • 04-vernier.jpg
  • 05-graph.jpg
  • 06-personalisation.jpg
  • 07-personalisation.jpg
  • 08-magview.jpg
  • 09-encoder.jpg
  • 10-encoder.jpg
  • 11-problem.jpg
  • 12-problem.jpg
  • 13-solutions.jpg
  • 14-montage.jpg
  • 15-montage.jpg

ISO/IEC Working Group 1: Regensburg, Germany

CTO Steve DeDera was pleased to have been a direct attendee and contributor to this invited ISO expert Working Group. This was a tri-annual expert Working Group 1 meeting recently held in Regensburg, Germany. Working Group 1 primarily focuses on Magnetic Stripe, Contact and Contactless Chip, Personalization, Physical Characteristics, Card Durability as well as the associated Test Methods for Cards and Passports.

The June meeting focused on:
  • Regulating the peel strength test
  • The second edition of the Card Service Life standard
  • New ESD (electric static discharge) test methods
 


All trademarks & logos are © their respective owners. All other content is © 1995-2016 to Card Testing International Ltd