CTI hosts the next ISO/IEC Meeting
As the New Zealand national delegates, CTI are privileged to host expert representatives from around the world, in our hometown of Wellington City, for the 2017 ISO/IEC Working Group 1 Meeting, the working group responsible for the physical attributes of cards. This includes the well known standards ISO/IEC 7810, 7811 series, 10373-1, 10373-2, 24789 and several others.
The group of 20-25 internationally delegated experts represent countries and major organisations involved in the field of ID cards, with a focus on developing the latest draft ISO Standards for ID, Magnetic Stripe, IC, Proximity and Durability testing. This is at the highest level of technical discussion, and is endorsed by both the International Organisation for Standardisation (ISO) and the International Electrotechnical Commission (IEC).
Card Testing International play an important role in the development of standards, offering years of specialist knowledge in the field. Through involvement in these meetings, CTI is able to stay updated on current and future developments in the card testing industry and can pass on these benefits to customers.
The meeting will run for three days, in which a part of this will be showcasing our beautiful city, also known as “The coolest little capital in the world”.