Contact Cards have a series of small pads, which provide an electrical connection with a reading device. The use of contact card technology is becoming more prevalent, with a growing number of new credit/debit card companies incorporating it in their products. This technology can also been seen in everyday devices such as cell phone SIM cards.
IC Contact Testing helps ensure the integrity and reliability of the card at the point of transaction. CTI tests contact IC cards to recognised ISO/IEC standards - evaluating for consistency and functionality in-line with what is expected internationally.
Electrostatic Discharge - Chip Damage
Common activities generate potential harmful charges damaging components. This can cause chip failure, in failed or dead components.
ISO Standards Partial Acknowledgement:
ISO/IEC 7810 Amd 1 Contact IC Card Requirements - 2000 V
ISO/IEC 7810 Amd 1 Proximity Card Requirements - 6000 V
Developing Standards suggest 8000 V
Dry Cold places are prone to seeing chip failures